Tip-sample distance control using photothermal actuation of a small cantilever for high-speed atomic force microscopy

摘要

We have applied photothermal bending of a cantilever induced by an intensity-modulated infrared laser to control the tip-surface distance in atomic force microscopy. The slow response of the photothermal expansion effect is eliminated by inverse transfer function compensation. By regulating the laser power and regulating the cantilever deflection, the tip-sample distance is controlled; this enables much faster imaging than that in the conventional piezoactuator-based z scanners because of the considerably higher resonant frequency of small cantilevers. Using this control together with other devices optimized for high-speed scanning, video-rate imaging of protein molecules in liquids is achieved. © 2007 American Institute of Physics.